Long-Term Stability Test on On-Wafer Measurement System in Frequency Ranges up to 325 GHz

被引：0
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作者：
Sakamaki, Ryo [1 ]
Horibe, Masahiro [1 ]
机构：
[1] National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan
来源：
IEEE Transactions on Instrumentation and Measurement | 2021年 / 70卷
关键词：
Scattering parameters;
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