HAXPES reference spectra of zirconium and zirconium oxide with Cr Kα excitation

被引：0
|
作者：
Zheng, Dong [1 ]
Young, Christopher N. [2 ]
Stickle, William F. [2 ]
机构：
[1] HP Singapore Private Ltd, Adv Mat & Test Ctr, 138 Depot Rd, Singapore 109683, Singapore
[2] HP Inc, Analyt & Dev Labs, Corvallis, OR 97330 USA
来源：
SURFACE SCIENCE SPECTRA | 2024年 / 31卷 / 02期
关键词：
Photoelectron spectroscopy - Zirconium;
D O I：
10.1116/6.0004028
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Hard x-ray photoelectron spectroscopy using monochromatic Cr K alpha radiation (5414.8 eV) has been used to acquire XPS and Auger data on sputtered zirconium and zirconium oxide samples. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.
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页数：23
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