An Offset-Cancellation Technique Using Charge-Trap Transistors and Asynchronous Programming Scheme

被引：0
|
作者：
Lin, Ye [1 ]
Jiang, Anying [1 ]
Lv, Jingjing [1 ]
Du, Yuan [1 ,2 ]
Du, Li [1 ,2 ]
机构：
[1] Nanjing Univ, Sch Elect Sci & Engn, Nanjing 210023, Peoples R China
[2] Nanjing Univ, Interdisciplinary Res Ctr Future Intelligent Chips, Suzhou 215163, Peoples R China
来源：
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS | 2024年 / 71卷 / 11期
关键词：
Charge-trap transistors (CTTs); offset-cancellation (OC); differential threshold voltage (Delta Vth); asynchronous programming; MEMORY; CMOS;
D O I：
10.1109/TCSII.2024.3443421
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this brief, a novel offset-cancellation (OC) technique is proposed, utilizing differential pair Charge-Trap Transistors (CTTs) to cancel offset voltage (VOS). The threshold voltage (Vth) degradation of programmed CTTs is characterized and modeled in TSMC 22-nm technology. By utilizing the Vth degradation model of CTTs, an asynchronous programming scheme is proposed to selectively program one of the CTTs based on the differential Vth ( $\Delta $ Vth) in each programming (PRG) operation of the differential pair CTTs. The experiment shows that the $\Delta $ Vth effectively reduces to less than 1mV, and displays negligible retention loss at 27 degrees C and 85 degrees C based on the differential pair CTTs and asynchronous programming scheme.
引用
收藏
页码：4638 / 4642
页数：5
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