Precise Wavelength Measurement of 543-nm Frequency Stabilized He-Ne Laser Using Optical Frequency Comb

被引：0
|
作者：
Qiuye, Yu [1 ,2 ]
Jianbo, Wang [2 ]
Cong, Yin [2 ]
Wenwen, Bi [2 ]
Lihua, Lei [3 ]
Baowu, Zhang [1 ]
Ming, Kong [1 ]
机构：
[1] College of Metrology & Measurement Engineering, China Jiliang University, Zhejiang, Hangzhou,310018, China
[2] National Institute of Metrology, Beijing,100029, China
[3] Shanghai Institute of Measurement and Testing Technology, Shanghai,201203, China
来源：
Zhongguo Jiguang/Chinese Journal of Lasers | 2024年 / 51卷 / 13期
关键词：
713.5 Other Electronic Circuits - 716.1 Information Theory and Signal Processing - 741.3 Optical Devices and Systems - 744.4 Laser Components - 961 Systems Science;
D O I：
10.3788/CJL231097
中图分类号：
学科分类号：
摘要：
30
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