A Square Pulse Thermoreflectance Technique for the Measurement of Thermal Properties

被引:0
|
作者
Idaho National Laboratory, Idaho Falls [1 ]
ID
83415, United States
不详 [2 ]
OH
43210, United States
机构
来源
关键词
Monte Carlo methods;
D O I
暂无
中图分类号
学科分类号
摘要
We report on a laser-based square pulse thermoreflectance (SPTR) technique for the measurement of thermal properties for a wide range of materials. SPTR adopts the pump-probe thermoreflectance principle to monitor the evolution of local temperature after square pulse excitation. The technique features a compact setup, high spatial resolution, and fast data collection. By comparing the acquired SPTR signals with a continuum heat transfer model, material thermal properties can be obtained. Taking advantage of various spot sizes and modulation frequencies, SPTR can measure both the thermal diffusivity and thermal conductivity of poorly to moderately conductive materials and the thermal conductivity of conductive materials with satisfactory accuracy, with potential to be applied to more conductive materials. The technique was validated on three materials: fused silica, single crystal CaF2 and single crystal nickel (with conductivities ranging from 1 W·m−1·K−1 to 100 W·m−1·K−1) with typical measurement errors of 5 % to 20 %. The leading sources of error have been identified by Monte Carlo simulations, and the primary limitations of SPTR are discussed. The compact, fiberized platform we describe here will allow instruments based on this methodology to be deployed in complex, multi-analytical environments for the type of high-throughput correlative analyses that are key to materials design and discovery. © 2022, Idaho National Laboratory, under exclusive licence to Springer Science+ Business Media, LLC., part of Springer Nature.
引用
收藏
相关论文
共 50 条
  • [21] Measurement of thermophysical properties by a pulse-heating technique
    萧鹏
    戴景民
    王青伟
    Chinese Optics Letters, 2007, (11) : 642 - 644
  • [22] Inversion for Thermal Properties with Frequency Domain Thermoreflectance
    Treweek, Benjamin
    Akcelik, Volkan
    Hodges, Wyatt
    Jarzembski, Amun
    Bahr, Matthew
    Jordan, Matthew
    McDonald, Anthony
    Yates, Luke
    Walsh, Timothy
    Pickrell, Gregory
    ACS APPLIED MATERIALS & INTERFACES, 2024, 16 (03) : 4117 - 4125
  • [23] Thermal Conductivity Measurement Technique for Cu-Pt Alloy Thin Films by a Modulated Thermoreflectance Method
    Miyake, Syugo
    Miyake, Aya
    Ikeda, Ken-ichi
    Takamatsu, Hiroyuki
    Kita, Takashi
    JOURNAL OF THE JAPAN INSTITUTE OF METALS, 2009, 73 (06) : 434 - 438
  • [24] Measurement of thermophysical properties by a pulse-heating technique
    Xiao, Peng
    Dai, Jingmin
    Wang, Qingwei
    CHINESE OPTICS LETTERS, 2007, 5 (11) : 642 - 644
  • [25] MEASUREMENT OF THERMAL CONDUCTIVITY AND INTERFACE THERMAL RESISTANCE OF MULTILAYERED THIN-FILMS USING VARIABLE PULSE-WIDTH TRANSIENT THERMOREFLECTANCE
    Burzo, Mihai G.
    INTERNATIONAL MECHANICAL ENGINEERING CONGRESS AND EXPOSITION - 2012, VOL 9, PTS A AND B, 2013, : 1101 - 1112
  • [26] Thermal properties measurement photoacoustic technique for hardmetals
    Machado, F. A. L.
    Faria, R. T., Jr.
    Filgueira, M.
    Rodrigues, M. F.
    Bobrovnitchii, G. S.
    Vargas, H.
    ADVANCED POWDER TECHNOLOGY V, 2006, 530-531 : 41 - +
  • [27] Thermal boundary resistance measurements using a transient thermoreflectance technique
    Smith, AN
    Hostetler, JL
    Norris, PM
    MICROSCALE THERMOPHYSICAL ENGINEERING, 2000, 4 (01): : 51 - 60
  • [28] Thermal-conductivity measurement by time-domain thermoreflectance
    David G. Cahill
    MRS Bulletin, 2018, 43 : 782 - 788
  • [29] Thermoreflectance Measurement of Temperature and Thermal Resistance of Thin Film Gold
    Cardenas, Christopher
    Fabris, Drazen
    Tokairin, Shawn
    Madriz, Francisco
    Yang, Cary Y.
    JOURNAL OF HEAT TRANSFER-TRANSACTIONS OF THE ASME, 2012, 134 (11):
  • [30] Thermal-conductivity measurement by time-domain thermoreflectance
    Cahill, David G.
    MRS BULLETIN, 2018, 43 (10) : 782 - 789