Focused electron beam induced deposition of magnetic tips for improved magnetic force microscopy

被引：0
|
作者：
Escalante-Quiceno, A.T. [1 ]
Fernández, V.V. [2 ]
Martín, J.I. [2 ,3 ]
Hierro-Rodriguez, A. [2 ,3 ,4 ]
Hlawacek, G. [5 ]
Jaafar, M. [6 ]
Asenjo, A. [6 ]
Magén, C. [1 ]
De Teresa, J.M. [1 ]
机构：
[1] Instituto de Nanociencia y Materiales de Aragon (INMA), CSIC-Universidad de Zaragoza, Zaragoza,50009, Spain
[2] Depto. Física, Universidad de Oviedo, Oviedo,33007, Spain
[3] CINN (CSIC-Universidad de Oviedo), El Entrego,33940, Spain
[4] SUPA, School of Physics and Astronomy, University of Glasgow, Glasgow,G12 8QQ, United Kingdom
[5] Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, Dresden,01328, Germany
[6] Instituto de Ciencia de Materiales de Madrid (ICMM-CSIC), Madrid,28049, Spain
来源：
Fizika Nizkikh Temperatur | 2024年 / 50卷 / 10期
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摘要：
Magnetic force microscopy
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页码：919 / 927
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