Analysis of uncertainty in measurement of electron temperature in low-pressure inductively coupled plasmas using microwave cutoff probe

被引:0
|
作者
Yeom, Hee-Jung [1 ]
Chae, Gwang-Seok [1 ,2 ]
Kim, Jung-Hyung [1 ]
Lee, Hyo-Chang [2 ,3 ]
机构
[1] Korea Res Inst Stand & Sci, Daejeon 34113, South Korea
[2] Korea Aerosp Univ, Dept Semicond Sci Engn & Technol, Goyang 10540, South Korea
[3] Korea Aerosp Univ, Sch Elect & Informat Engn, Goyang 10540, South Korea
来源
PLASMA SOURCES SCIENCE & TECHNOLOGY | 2024年 / 33卷 / 11期
基金
新加坡国家研究基金会;
关键词
cutoff probe; microwave diagnostic; electron temperature; uncertainty; ABSORPTION PROBE; DENSITY;
D O I
10.1088/1361-6595/ad9054
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
In this study, we performed electron temperature measurements by using a square cutoff probe (CP). Further, the measurement uncertainty was comprehensively analysed. The square CP allows for the measurement of the electron temperature based on the measured electron series resonance frequency and that of the electron plasma frequency based on the transmission spectrum of the plasma. The electron temperatures were determined under varying gas pressures and input power conditions, and the results were compared with those obtained using a single Langmuir probe. Also, the impact of electron-neutral collision frequency on electron temperature measurement using square CP was analysed based on a plasma equivalent circuit model. The square CP is expected to serve as a valuable diagnostic tool for the precise characterization of electron temperature, offering localized, accurate, and easily interpretable features.
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页数:7
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