Domain orientation imaging of PbTiO3 single crystals by vertical and lateral piezoresponse force microscopy

被引：0
|
作者：
Okino, Hirotake [1 ]
Ida, Teruhiko [1 ]
Ebihara, Hiroshi [1 ]
Yamada, Hirofumi [2 ]
Matsushige, Kazumi [2 ]
Yamamoto, Takashi [1 ]
机构：
[1] Department of Communications Engineering, National Defense Academy, 1-10-20 Hashirimizu, Yokosuka, Kanagawa 239-8686, Japan
[2] Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Yoshida Honmachi, Sakyo-ku, Kyoto 606-8501, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2001年 / 40卷 / 9 B期
关键词：
Domain imaging - Piezoresponseforce microscopy (PFM);
D O I：
10.1143/jjap.40.5828
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：5828 / 5832
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