Scanning tunneling microscope light emission spectroscopy with good signal-to-noise ratio

被引：0
|
作者：
Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan [1 ]
不详 [2 ]
机构：
来源：
Shinku | 2008年 / 12卷 / 796-800期
关键词：
Signal to noise ratio - Optical emission spectroscopy - Microscopes;
D O I：
10.3131/jvsj2.51.796
中图分类号：
学科分类号：
摘要：
Scanning tunneling microscope (STM) light emission spectroscopy provides a powerful tool for characterization of individual nanometer scale structures on solid surfaces. However, the light to be detected is usually very weak. It is desirable to improve the intensity level for measurements with good signal-to-noise ratio. For this purpose the role that the STM tip-sample gap plays in the light emission is analyzed by the dielectric theory of STM light emission. Based on the theoretical predictions, we discuss how one can obtain strong STM light emission and problems associated with the enhancement of emission.
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页码：796 / 800
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