Single event upset in static random access memories in atmospheric neutron environments

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作者：
Arita, Yutaka [1 ]
Takai, Mikio [1 ]
Ogawa, Izumi [2 ]
Kishimoto, Tadafumi [2 ]
机构：
[1] Res. Ctr. Mat. Sci. at Extreme C., Grad. School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
[2] Department of Physics, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
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| 1600年 / Japan Society of Applied Physics卷 / 42期
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