Finding the invisible contaminants in CMOS image sensor pixels: The DCS technique

被引:0
|
作者
Domengie, Florian [1 ]
Morin, Pierre [1 ]
Bauza, Daniel [2 ]
机构
[1] Domengie, Florian
[2] Morin, Pierre
[3] Bauza, Daniel
来源
Domengie, F. (forian.domengie@st.com) | 1600年 / ASM International卷 / 14期
关键词
Pixels;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:4 / 11
相关论文
共 50 条
  • [31] A CMOS Image Sensor Using High Speed Lock-In Pixels for Stimulated Raman Scattering
    Lioe, DeXing
    Mars, Kamel
    Takasawa, Taishi
    Yasutomi, Keita
    Kagawa, Keiichiro
    Hashimoto, Mamoru
    Kawahito, Shoji
    HIGH-SPEED BIOMEDICAL IMAGING AND SPECTROSCOPY: TOWARD BIG DATA INSTRUMENTATION AND MANAGEMENT, 2016, 9720
  • [32] Development of a production-ready, back-illuminated CMOS image sensor with small pixels
    Joy, Tom
    Pyo, Sunggyu
    Park, Sunghyung
    Choi, Changhoon
    Palsule, Chintamani
    Han, Hyungjun
    Feng, Chen
    Lee, Sangjoo
    McKee, Jeff
    Altice, Parker
    Hong, Chris
    Boemler, Christian
    Hynecek, Jerry
    Louie, Michael
    Lee, Juil
    Kim, Daebyung
    Haddad, Homayoon
    Pain, Bedabrata
    2007 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, VOLS 1 AND 2, 2007, : 1007 - +
  • [33] A high speed 1000 fps CMOS image sensor with low noise global shutter pixels
    Zhou YangFan
    Cao ZhongXiang
    Qin Qi
    Li QuanLiang
    Shi Cong
    Wu NanJian
    SCIENCE CHINA-INFORMATION SCIENCES, 2014, 57 (04) : 1 - 8
  • [34] Research of digital noise reduction technique in CMOS image sensor
    ASIC Design Center, School of Electronic and Information Engineering, Tianjin Univ., Tianjin 300072, China
    Guangdianzi Jiguang, 2007, 4 (411-413):
  • [35] A new visible watermarking technique applied to CMOS image sensor
    Yu, Pingping
    Shang, Yan
    Li, Chunming
    MIPPR 2013: MULTISPECTRAL IMAGE ACQUISITION, PROCESSING, AND ANALYSIS, 2013, 8917
  • [36] A Compressive Sensing CMOS Image Sensor With Partition Sampling Technique
    Lee, Hyunkeun
    Kim, Woo-Tae
    Kim, Jinho
    Chu, Myonglae
    Lee, Byung-Geun
    IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2021, 68 (09) : 8874 - 8884
  • [37] Implementation of real-time image edge detector based on a bump circuit and active pixels in a CMOS image sensor
    Nam, Minho
    Cho, Kyoungrok
    INTEGRATION-THE VLSI JOURNAL, 2018, 60 : 56 - 62
  • [38] A SOI-based CMOS-MEMS IR image sensor with partially released reference pixels
    Kwon, H.
    Suzuki, K.
    Ishii, K.
    Yagi, H.
    Honda, H.
    Atsuta, M.
    Fujiwara, I.
    Sasaki, K.
    Ogata, M.
    Ueno, R.
    Funaki, H.
    JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2011, 21 (02)
  • [39] A high-speed CMOS image sensor with global electronic shutter pixels using pinned diodes
    Graduate School of Electronic Science and Technology, Shizuoka University, 3-5-1 Johoku, Hamamatsu, 432-8011, Japan
    不详
    不详
    不详
    IEEJ Trans. Sens. Micromach., 10 (321-327):
  • [40] FDTD-based optical simulations methodology for CMOS image sensor pixels architecture and process optimization
    Hirigoyen, Flavien
    Crocherie, Axel
    Vaillant, Jerome
    Cazaux, Yvon
    SENSORS, CAMERAS, AND SYSTEMS FOR INDUSTRIAL/SCIENTIFIC APPLICATIONS IX, 2008, 6816