The state and the problem in case of inspection of the printed circuit board

被引:0
|
作者
机构
关键词
D O I
10.5104/jiep.19.27
中图分类号
学科分类号
摘要
[No abstract available]
引用
收藏
页码:27 / 29
页数:2
相关论文
共 50 条
  • [31] Design and Implementation on Printed Circuit Board Quality Inspection Integration Platform
    Luo, Laiping
    Zhang, Jing
    Zhu, Lifang
    Liu, Chengshui
    Hu, Xinglin
    FRONTIERS OF MANUFACTURING SCIENCE AND MEASURING TECHNOLOGY III, PTS 1-3, 2013, 401 : 1547 - +
  • [32] Automated inspection of printed circuit board patterns referenced to CAD data
    Hara, Y
    Doi, H
    Karasaki, K
    Iida, T
    Furutani, T
    Kitamura, S
    Minatani, N
    Shinada, S
    INTERNATIONAL JOURNAL OF THE JAPAN SOCIETY FOR PRECISION ENGINEERING, 1995, 29 (04): : 311 - 317
  • [33] Genetic algorithm based printed circuit board (PCB) inspection system
    Mashohor, S
    Evans, JR
    Arslan, T
    2004 IEEE INTERNATIONAL SYMPOSIUM ON CONSUMER ELECTRONICS, PROCEEDINGS, 2004, : 519 - 522
  • [35] SOLVING A RELIABILITY PROBLEM IN PRINTED-CIRCUIT BOARD FABRICATION
    HAMMERBERG, CC
    SMITH, AW
    METAL PROGRESS, 1979, 116 (03): : 54 - 56
  • [36] Integer programming approach to the printed circuit board grouping problem
    Yu, S
    Kim, D
    Park, S
    INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, 2005, 43 (08) : 1667 - 1684
  • [37] FUTURE ADMINISTRATION - PROBLEM OF PRINTED-CIRCUIT BOARD MANAGEMENT
    不详
    GALVANOTECHNIK, 1979, 70 (08): : 803 - &
  • [38] Printed Circuit Board Interconnect Fault Inspection Based on Eddy Current Testing
    Socheatra, S.
    Ali, N. B. Zain
    Khir, M. H. Md
    2014 5TH INTERNATIONAL CONFERENCE ON INTELLIGENT AND ADVANCED SYSTEMS (ICIAS 2014), 2014,
  • [39] A teaching system fostering expertise for the tuning of printed circuit board inspection systems
    Wada, Hirotaka
    Nakajima, Akira
    Sawaragi, Tetsuo
    Horiguchi, Yukio
    IECON 2006 - 32ND ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS, VOLS 1-11, 2006, : 2066 - +
  • [40] Wavelet-based processing of ECT images for inspection of printed circuit board
    Taniguchi, T
    Kacprzak, D
    Yamada, S
    Iwahara, M
    IEEE TRANSACTIONS ON MAGNETICS, 2001, 37 (04) : 2790 - 2793