Quantitative evaluation of statistical errors in small-angle X-ray scattering measurements

被引：0
|
作者：
Sedlak, Steffen M. [1 ]
Bruetzel, Linda K. [1 ]
Lipfert, Jan [1 ]
机构：
[1] Department of Physics, Nanosystems Initiative Munich, Center for NanoScience, LMU Munich, Amalienstrasse 54, Munich,80799, Germany
来源：
Journal of Applied Crystallography | 2017年 / 50卷 / 02期
关键词：
Measurement errors - X ray detectors;
D O I：
暂无
中图分类号：
O572 [高能物理学];
学科分类号：
摘要：
引用
收藏
页码：621 / 630
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