Determination of thickness, refractive index, and thickness irregularity for semiconductor thin films from transmission spectra

被引：1

作者：

Aqili, Akram K. S. ^{[1
]}

Maqsood, Asghari ^{[1
]}

机构：

[1] Thermal Physics Laboratory, Department of Physics, Quaid-i-Azam University, Islamabad, Pakistan

来源：

Applied Optics | 2002年 / 41卷 / 01期

关键词：

Semiconductor thin films;

D O I：

10.1364/ao.41.000218

中图分类号：

学科分类号：

摘要：

引用

页码：218 / 224

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