Adversarial robustness of deep convolutional neural network-based image recognition models: A review

被引：0
|
作者：
Sun, Hao [1 ]
Chen, Jin [2 ]
Lei, Lin [1 ]
Ji, Kefeng [1 ]
Kuang, Gangyao [1 ]
机构：
[1] State Key Lab. of Complex Electromagnetic Environment Effects on Electronics and Information System, National University of Defense Technology, Changsha,410073, China
[2] Beijing Institute of Remote Sensing Information, Beijing,100192, China
来源：
Journal of Radars | 2021年 / 10卷 / 04期
关键词：
154;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
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页码：571 / 594
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