Correlation analysis approach based fault diagnosis of analog VLSI circuits

被引：0
|
作者：
Xie, Yongle [1 ]
机构：
[1] School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China
来源：
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 2007年 / 28卷 / 12期
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摘要：
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页码：1999 / 2005
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