Quantitative analysis of energetic materials with X-ray diffraction and Rietveld refinement

被引：0
|
作者：
机构：
[1] Herrmann, M.
[2] Engel, W.
来源：
Herrmann, M. | 2000年 / Trans Tech Publ, Uetikon-Zuerich, Switzerland卷 / 321期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] Rietveld refinement of the BaTiO3 from X-ray powder diffraction
    Sun Feng
    Yin Yansheng
    MULTI-FUNCTIONAL MATERIALS AND STRUCTURES II, PTS 1 AND 2, 2009, 79-82 : 593 - 596
  • [22] X-RAY RIETVELD STRUCTURE REFINEMENT OF ErNiSb
    Zeng Lingmin
    Transactions of Nonferrous Metals Society of China, 1998, (01) : 19 - 20
  • [23] X-ray Rietveld structure refinement of ErNiSb
    Zeng, LM
    Yan, JL
    Ou, XL
    He, W
    Zhuang, YH
    TRANSACTIONS OF NONFERROUS METALS SOCIETY OF CHINA, 1998, 8 (01) : 18 - 19
  • [24] Rietveld x-ray diffraction and x-ray fluorescence analysis of Australian Aboriginal ochres
    Jercher, M
    Pring, A
    Jones, PG
    Raven, MD
    ARCHAEOMETRY, 1998, 40 : 383 - 401
  • [25] X-ray diffraction analysis by Rietveld refinement of FeAl alloys doped with terbium and its correlation with magnetostriction
    J.S.Uribe-Chavira
    G.Herrera-Pérez
    C.R.Santillán-Rodríguez
    R.J.Sáenz-Hernández
    J.A.Matutes-Aquino
    M.C.Grijalva-Castillo
    JournalofRareEarths, 2023, 41 (08) : 1217 - 1224
  • [26] Structure Evolution In CIGS Deposition: An X-ray Diffraction Analysis With Rietveld Whole-Pattern Refinement
    Reese, Thaddeus A.
    Schujman, Sandra B.
    Matyi, Richard J.
    2014 IEEE 40TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC), 2014, : 1691 - 1695
  • [27] X-ray diffraction analysis by Rietveld refinement of FeAl alloys doped with terbium and its correlation with magnetostriction
    Uribe-Chavira, J. S.
    Herrera-Perez, G.
    Santillan-Rodriguez, C. R.
    Saenz-Hernandez, R. J.
    Matutes-Aquino, J. A.
    Grijalva-Castillo, M. C.
    JOURNAL OF RARE EARTHS, 2023, 41 (08) : 1217 - 1224
  • [28] QUANTITATIVE X-RAY DIFFRACTION ANALYSIS
    COPELAND, LE
    BRAGG, RH
    ANALYTICAL CHEMISTRY, 1958, 30 (02) : 196 - 201
  • [29] On the quantitative phase analysis and amorphous content of triacylglycerols materials by X-ray Rietveld method
    Calligaris, Guilherme A.
    da Silva, Thais L. T.
    Ribeiro, Ana Paula B.
    dos Santos, Adenilson O.
    Cardoso, Lisandro P.
    CHEMISTRY AND PHYSICS OF LIPIDS, 2018, 212 : 51 - 60
  • [30] X-ray powder diffraction data and Rietveld refinement for rare earth compound ErCoSn
    Wu, Shiwei
    Zhang, Liping
    Zeng, Lingmin
    Yan, Jialin
    He, Wei
    Zhongguo Youse Jinshu Xuebao/Chinese Journal of Nonferrous Metals, 9 (SUPPL. 1): : 242 - 245
12345