Carbon - Rubidium compounds - Surface properties - Synchrotron radiation - Thin films - X ray photoelectron spectroscopy;
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摘要:
Rb3C60 thin film was prepared on the (111) surface of C60 single crystal. The energy band structure of the sample was measured at low temperature by using the synchrotron radiation photoemission spectrum technique. The observed band dispersion revealed that the sample was Rb3C60 single crystal film. The stability of the interface between Rb3C60 and C60 was studied for the first time by X-ray photoelectron spectroscopy. The result showed that the interface was stable below about 420 K.