Dielectric properties of Ba1-xSrxTiO3 films grown on LaAlO3 substrates

被引：0
|
作者：
Gim, Y. [1 ]
Hudson, T. [1 ]
Fan, Y. [1 ]
Findikoglu, A.T. [1 ]
Kwon, C. [1 ]
Gibbons, B.J. [1 ]
Jia, Q.X. [1 ]
机构：
[1] Los Alamos Natl Lab, United States
来源：
Materials Research Society Symposium - Proceedings | 2000年 / 603卷
关键词：
Barium compounds - Capacitance measurement - Crystal structure - Deposition - Electric field effects - Film growth - Hysteresis - Lanthanum compounds - Pulsed laser applications - Thermal effects - Voltage measurement - X ray analysis;
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学科分类号：
摘要：
We report the crystal structures and dielectric properties of barium strontium titanate, Ba1-xSrxTiO3 (BST), films deposited on LaAlO3 substrates using pulsed laser deposition, where x = 0.1 to 0.9 at an interval of 0.1. We have found that when x 0.6Sr0.4TiO3 film exhibits the largest capacitance tunability ( 37%) with an applied electric field of 40 kV/cm.
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页码：175 / 180
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