Parallel repairable system with two types of failure and vacation

被引：0
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作者：
Hu, Lin-Min [1 ]
Yue, De-Quan [1 ]
Tian, Rui-Ling [1 ]
机构：
[1] Coll. of Science, Yanshan Univ., Qinhuangdao 066004, China
来源：
Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics | 2007年 / 29卷 / 12期
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页码：2180 / 2184
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