Comparative study on structural properties of poly(3-hexylthiophene) and poly(3-hexylthiophene):6,6-phenyl-C6i butyric acid methyl ester thin films using synchrotron X-ray diffraction

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Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, lbaraki 305-8573, Japan [1 ]
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Jpn. J. Appl. Phys. | / 1 Part 2卷
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Number:; 22340086; Acronym: [!text type='JS']JS[!/text]PS; Sponsor: Japan Society for the Promotion of Science;
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摘要：
X ray diffraction
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