Influence of defects in SiOx thin films on their barrier properties

被引:0
|
作者
Grüniger, A. [1 ]
Von Rohr, Ph. Rudolf [1 ]
机构
[1] Swiss Fed. Inst. of Technol. Zurich, Institute of Process Engineering, CH-8092 Zurich, Switzerland
来源
Thin Solid Films | / 1-2卷 / 308-312期
关键词
Compendex;
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摘要
Composite materials - Crack initiation - Deposition - Diffusion - Laminates - Packaging materials - Plastic films - Silica
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