Aberration-corrected scanning transmission electron microscopy: The potential for nano- and interface science

被引：0
|
作者：
Pennycook, S.J. [1 ,2 ]
Lupini, A.R. [1 ]
Kadavanich, A. [1 ,3 ]
McBride, J.R. [3 ]
Rosenthal, S.J. [2 ,3 ]
Puetter, R.C. [4 ]
Yahil, A. [4 ]
Krivanek, O.L. [5 ]
Dellby, N. [5 ]
Nellist, P.D.L. [5 ]
Duscher, G. [1 ,6 ]
Wang, L.G. [1 ]
Pantelides, S.T. [1 ,2 ]
机构：
[1] Solid State Division, Oak Ridge National Laboratory, Oak Ridge,TN, United States
[2] Department of Physics and Astronomy, Vanderbilt University, Nashville,TN, United States
[3] Department of Chemistry, Vanderbilt University, Nashville,TN, United States
[4] Pixon LLC, 11 Night Heron Drive, Stony Brook,NY, United States
[5] Nion Co., Kirkland,WA, United States
[6] Department of Materials Science and Engineering, North Carolina State University, Raleigh,NC, United States
来源：
International Journal of Materials Research | 2003年 / 94卷 / 04期
关键词：
This research was supported by U. S. Department of Energy under contract DE-AC05-00OR22725 managed by UT-Battelle; LLC; and by appointment to the ORNL Postdoctoral Research Program administered jointly by ORNL and ORISE. Computation time was partially supported by the National Science Foundation under DMR990002N and DMR000004N and utilized the SGI Origin 2000 at the National Center for Supercomputing Applications; University of Illinois at Urbana-Champaign;
D O I：
10.1515/ijmr-2003-0065
中图分类号：
学科分类号：
摘要：
53
引用
收藏
页码：350 / 357
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