On the number of independent structural parameters calculated for thin films from X-ray reflectometry data

被引：0
|
作者：
Samoilenko, I.I. [1 ]
Feigin, L.A. [1 ]
Shchedrin, B.M. [1 ]
Yanusova, L.G. [1 ]
机构：
[1] A. V. Shubnikov Inst. of Crystal., Russian Academy of Sciences, Moscow, Russia
来源：
Surface Investigation X-Ray, Synchrotron and Neutron Techniques | 2001年 / 16卷 / 09期
关键词：
Algorithms - Manganese compounds - Reflectometers - Thin films - X ray analysis;
D O I：
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中图分类号：
学科分类号：
摘要：
An algorithm based on quantitative criteria of the independence of parameters was proposed for modeling a film according to X ray reflectometry data. The efficiency of the algorithm was demonstrated by interpreting the simulation data for a Langmuir-Blodgett film of manganese stearate. The method developed can be useful both for treating the real data and for designing the experiments.
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页码：1381 / 1386
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