Split-post and split-cylinder resonator techniques: A comparison of complex permittivity measurement of dielectric substrates

被引：0
|
作者：
Janezic, Michael D. [1 ]
Krupka, Jerzy [2 ]
机构：
[1] Electromagnetics Division, National Institute of Standards and Technology, Boulder, CO 80305, United States
[2] Institute of Microelectronics and Optoelectronics, Warsaw University of Technology, Warsaw, Poland
来源：
Journal of Microelectronics and Electronic Packaging | 2009年 / 6卷 / 02期
关键词：
Compendex;
D O I：
10.4071/1551-4897-6.2.97
中图分类号：
学科分类号：
摘要：
Permittivity
引用
收藏
页码：97 / 100
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