Stability of measurement of heterojunction bipolar transistors current-voltage characteristics with thermal effect

被引：0
|
作者：
Wei, Sun-Chin [1 ]
Su, Yan-Kuin [1 ]
Wang, Ruey-Lue [2 ]
机构：
[1] Department of Electrical Engineering, Institute of Microelectronics, National Cheng Kung University, No. 1, Ta Hsueh Rd., Tainan, 70101, Taiwan
[2] Department of Electronic Engineering, Ku Shan University of Technology, No. 949, DaWan Rd., Tainan Hsien, 710, Taiwan
来源：
Japanese Journal of Applied Physics, Part 2: Letters | 2002年 / 41卷 / 12 A期
关键词：
D O I：
10.1143/jjap.41.l1360
中图分类号：
学科分类号：
摘要：
9
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