Optimal burn-in time for competing failure products involving catastrophic and degradation failures

被引：0
|
作者：
Huang, Xiu-Ping [1 ]
Tang, Yan-Zhen [1 ]
Sun, Quan [1 ]
Zhou, Jing-Lun [1 ]
机构：
[1] College of Information System and Management, National University of Defense Technology, Changsha 410073, China
来源：
Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics | 2013年 / 35卷 / 08期
关键词：
Defects;
D O I：
10.3969/j.issn.1001-506X.2013.08.35
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1803 / 1808
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