Structural characterization of II-VI semiconductor nanoparticles

被引：20
|
作者：
Neder, R.B. [1 ]
Korsunskiy, V.I. [1 ]
Chory, Ch. [2 ]
Müller, G. [2 ]
Hofmann, A. [3 ]
Dembski, S. [3 ]
Graf, Ch. [3 ,4 ]
Rühl, E. [3 ,5 ]
机构：
[1] Universität Würzburg, Institut für Mineralogie, Am Hubland, 97074 Würzburg, Germany
[2] Universität Würzburg, Silicatchemie, Röntgenring, 97070 Würzburg, Germany
[3] Universität Würzburg, Institut für Physikalische Chemie, Am Hubland, 97074 Würzburg, Germany
[4] Freie Universität Berlin, Physikalische und Theoretische Chemie, Takustr. 3, 14195 Berlin, Germany
[5] Physikalische und Theoretische Chemie, Freie Universität Berlin, Takustr. 3, 14195 Berlin, Germany
来源：
Physica Status Solidi (C) Current Topics in Solid State Physics | 2007年 / 4卷 / 09期
关键词：
Computer simulation - Semiconducting zinc compounds - Structural properties - X ray powder diffraction - Zinc oxide;
D O I：
10.1002/pssc.200775409
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：3221 / 3233
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