Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions

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[1] [1,Delmotte, Franck
[2] Meyer-Ilse, Julia
[3] Salmassi, Farhad
[4] 1,Soufli, Regina
[5] Burcklen, Catherine
[6] Rebellato, Jennifer
[7] Jérome, Arnaud
[8] Vickridge, Ian
[9] Briand, Emrick
[10] Gullikson, Eric
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| 1600年 / American Institute of Physics Inc.卷 / 124期
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