Deposition temperature effect on structural and gas sensing properties of TeO2 thin films

被引：0
|
作者：
Manouchehrian, M. [1 ]
机构：
[1] Department of Physics, South Tehran Branch, Islamic Azad University, P.O. Box 31485-498, Tehran, Iran
来源：
International Journal of Microstructure and Materials Properties | 2015年 / 10卷 / 5-6期
关键词：
D O I：
10.1504/IJMMP.2015.074997
中图分类号：
学科分类号：
摘要：
10
引用
收藏
页码：463 / 471
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