Phase composition diagnostics of the CeO2/Si(111) system by Auger depth profiling

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Beshenkov, V.G.
Zhamenskij, A.G.
Marchenko, V.A.
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Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya | 2003年 / 03期
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页码：108 / 110
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