Development of UV light-emitting diodes based AlGaN/GaN heterojunction utilizing thermal oxidation annealing

被引:1
|
作者
Li, Qiuen [1 ,2 ]
Kang, Xuanwu [1 ]
Wu, Hao [1 ]
Zheng, Yingkui [1 ]
Liu, Xinyu [1 ]
Huang, Chengjun [1 ,2 ]
机构
[1] Chinese Acad Sci, Inst Microelect, Beijing, Peoples R China
[2] Univ Chinese Acad Sci, Sch Integrated Circuits, Beijing, Peoples R China
关键词
SENSOR; NIO;
D O I
10.1063/5.0218081
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Ultraviolet (UV) irradiation has a significant impact on enhancing the performance of sensors. Currently, there is still an urgent need for devices that are simple and easy to fabricate. In this work, a cost-effective and convenient method was employed to fabricate a UV light emitting diode. A four-inch silicon based AlGaN/GaN heterojunction substrate was used. The Ni/Au (20/20 nm) layer was deposited on the AlGaN barrier layer, followed by thermal oxidation to prepare the UV diode. The diode annealed in oxygen can emit UV light at a wavelength of 365 nm and is visible, and no light is emitted from the device in nitrogen annealing. The I-V and C-V characteristics of the device are tested to explore the mechanism. Transmission electron microscopy and technology computer aided design simulation methods were used to analyze the device luminescence mechanism. (c) 2024 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
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页数:5
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