Current transport through stacked InAs quantum dots embedded in a schottky barrier

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作者
Li, Hong-Wei [1 ]
Wang, Tai-Hong [1 ]
机构
[1] Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China
来源
Wuli Xuebao/Acta Physica Sinica | 2001年 / 50卷 / 12期
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摘要
We have investigated the transport properties of a metal-semiconductor-metal structure containing multi-layers of InAs quantum dots from 77 K to room temperature. Three distinct phenomena are observed in the current-voltage(I-V) curves: the hysteresis loops, current jumps and voltage offsets. Because of the coupling between the multi-layered quantum dots, the devices made of these quantum dots exhibit much more complicated phenomenon than the devices containing single-layer quantum dots. The devices may undergo many metastable states and relaxation processes. These processes would induce current jump structures and noise in the I-V curve.
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页码:2509 / 2510
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