Extended-range temporal electronic speckle pattern interferometry

被引:0
|
作者
Servin, Manuel [1 ]
Davila, Abundio [1 ]
Quiroga, Juan Antonio [1 ]
机构
[1] Centro de Invest. en Optica A.C., Apartado Postal 1-948, 37150 Leon Guanajuato, Mexico
来源
Applied Optics | 2002年 / 41卷 / 22期
关键词
Algorithms - Frequencies - Imaging techniques - Interferometry - Laser pulses - Light modulation - Time domain analysis - Video cameras;
D O I
暂无
中图分类号
学科分类号
摘要
In recent years the availability of high-speed digital video cameras has motivated the study of electronic speckle pattern interferometry (ESPI) in the time domain. To this end a properly sampled temporal sequence of N-fringe patterns is used to analyze the temporal experiment. Samples of temporal speckle images must fulfill the Nyquist criteria over the time axis. When the transient phenomena under study are too fast, the required sampling frequency over time may not be fulfilled. In that case one needs to extend the measuring range of the algorithm used to extract the modulating phase. We analyze how to use short laser pulses or short video acquisition times with fairly long temporal separation among them to estimate the modulating phase of a dynamic ESPI experiment. The only requirement is that the modulating phase being estimated be properly sampled in the spatial domain. © 2002 Optical Society of America.
引用
收藏
页码:4541 / 4547
相关论文
共 50 条
  • [41] Variational denoising method for electronic speckle pattern interferometry
    张芳
    刘文耀
    唐晨
    王晋疆
    任丽
    ChineseOpticsLetters, 2008, (01) : 38 - 40
  • [42] NDE METHOD USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    HOLOWNIA, BP
    NDE OF ADHESIVE BONDS AND BONDLINES, 1989, : 98 - 100
  • [43] Electronic speckle pattern interferometry using vortex beams
    Restrepo, Rene
    Uribe-Patarroyo, Nestor
    Belenguer, Tomas
    OPTICS LETTERS, 2011, 36 (23) : 4644 - 4646
  • [44] Recent developments and applications in electronic speckle pattern interferometry
    Petzing, JN
    Tyrer, JR
    JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN, 1998, 33 (02): : 153 - 169
  • [45] Use of electronic speckle pattern interferometry in fluid physics
    Dupont, O
    Joannes, L
    Dewandel, JL
    Legros, JC
    INTERFEROMETRY IN SPECKLE LIGHT: THEORY AND APPLICATIONS, 2000, : 379 - 386
  • [46] Tube junction study by electronic speckle pattern interferometry
    Yeras, AM
    SPECKLE METROLOGY 2003, PROCEEDINGS, 2003, 4933 : 342 - 345
  • [47] Study of rubber blends by electronic speckle pattern interferometry
    Bakosova, Dana
    Kopal, Ivan
    20TH INTERNATIONAL CONFERENCE MACHINE MODELING AND SIMULATIONS, MMS 2015, 2016, 136 : 233 - 238
  • [48] Singlemode optical fiber electronic speckle pattern interferometry
    Xi'an Jiaotong Univ, Xi'an, China
    Opt Lasers Eng, 2-3 (103-109):
  • [49] ELECTRONIC SPECKLE PATTERN INTERFEROMETRY MEASUREMENT OF RESIDUAL STRESS
    Sedivy, Otomar
    Krempaszky, Christian
    Holy, Stanislav
    25TH DANUBIA-ADRIA SYMPOSIUM ON ADVANCES IN EXPERIMENTAL MECHANICS, 2008, : 229 - 230
  • [50] INTERFEROMETRIC COMPARISON OF DISPLACEMENTS BY ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    LOKBERG, OJ
    SLETTEMOEN, GA
    APPLIED OPTICS, 1981, 20 (15): : 2630 - 2634