Conduction-related voltage instabilities in double-layer dielectric films

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作者：
Evseev, S. [1 ]
Cacciato, A. [1 ]
Van Der Pol, J. [1 ]
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[1] Philips Semiconductors, PMO, Gerstweg 2, 6534AE Nijmegen, Netherlands
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| 1600年 / American Institute of Physics Inc.卷 / 91期
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