Measurement of wavefront power spectral density of large optical components

被引：0

作者：

Xu, Q. ^{[1
]}

Gu, Y.Y. ^{[1
]}

Chai, L. ^{[1
]}

Li, W. ^{[1
]}

机构：

[1] Chengdu Fine Opt. Eng. Res. Cent., Chengdu 610041, China

来源：

Guangxue Xuebao/Acta Optica Sinica | 2001年 / 21卷 / 03期

关键词：

Error detection - Fourier optics - Inertial confinement fusion - Optical resolving power - Solid state lasers - Wavefronts;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The optical components employed in high power density solid-state laser for inertial confinement fusion (ICF) must be measured at full aerture to provide the higher resolution measurements which are necessary for detecting mid-spatial-frequency errors in the wavefront. The use of Fourier analysis techniques to measure the wavefront power spectral density (PSD) in mid-frequency domain is discussed. A large phase-shifting Fizeau interferometer is used for the measurement. The phase wavefront detected by the interferometer is digitally processed to create one dimension wavefront PSD. The PSD of several optical components are shown.

引用

页码：344 / 347

共 50 条

[11] Systematic Errors in the Measurement of Power Spectral Density
Mack, Chris A.
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXVII, 2013, 8681
[12] Systematic errors in the measurement of power spectral density
Mack, Chris A.
JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2013, 12 (03):
[13] MEASUREMENT OF SPECTRAL DENSITY BY CROSS-POWER DENSITY SPECTRUM
HARKER, KJ
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1973, 18 (10): : 1369 - 1369
[14] Characterization of power spectral density of optical surface
MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai
200092, China
不详
200092, China
Hongwai yu Jiguang Gongcheng Infrared Laser Eng., 12 (3707-3712):
[15] Interferometric test of power spectral density in spatial medium frequency band of wavefront
Gao, Zhishan
Chen, Jinbang
He, Yong
Zhang, Guoan
Wu, Xinmin
Zhongguo Jiguang/Chinese Journal of Lasers, 2000, 27 (04): : 327 - 331
[16] PRECISION OPTICAL WAVEFRONT MEASUREMENT
SCHAHAM, M
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1981, 306 : 183 - 191
[17] Spectral Wavefront Optical Reconstruction by Diffraction
Frumker, E.
Paulus, G. G.
Niikura, H.
Villeneuve, D. M.
Corkum, P. B.
2010 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) AND QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (QELS), 2010,
[18] MEASUREMENT OF THE MUTUAL SPECTRAL DENSITY OF POWER BY ACOUSTOOPTICAL PROCESSORS
BOKOV, LA
KRAKOVSKY, VA
PUGOVKIN, AV
RADIOTEKHNIKA I ELEKTRONIKA, 1982, 27 (06): : 1197 - 1202
[19] MEASUREMENT OF SPECTRAL DENSITY OF NOISE POWER WITH A SELECTIVE VOLTMETER
RYUMSHIN, VI
MEASUREMENT TECHNIQUES, 1975, 18 (06) : 858 - 859
[20] More systematic errors in the measurement of power spectral density
Mack, Chris A.
JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2015, 14 (03):

← 1 2 3 4 5 →