Effect of normalization on the microstructure and texture evolution during primary and secondary recrystallization of Hi-B electrical steel

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机构
[1] Cheng, Zhao-Yang
[2] Liu, Jing
[3] Yang, Jia-Xin
[4] Zhu, Jia-Chen
[5] Liu, Shuai
[6] Xiang, Zhi-Dong
来源
Liu, Jing (liujing@wust.edu.cn) | 1600年 / National Institute of Science Communication and Information Resources卷 / 23期
关键词
III-V semiconductors - Recrystallization (metallurgy) - Aluminum nitride;
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摘要
Normalization, as an important process step in the production of Hi-B electrical steels, influences the microstructure and texture evolution during the subsequent primary and secondary recrystallization annealing. The effects are investigated by TEM, EBSD and XRD for a Hi-B electrical steel. The results show that large numbers of small and dispersed AlN precipitated after normalizing treatment. The precipitated AlN inhibitors promoted the formation of CSL boundaries of Σ = 3, 11 and 13b, and boundaries with misorientation angles between 25-45º during the primary recrystallization, which are believed to promote the selective growth of the Goss grains during secondary recrystallization. After primary recrystallization, the normalized specimen showed the increase in the intensity of {111} component and the decrease of the α*-fiber intensity. As a result, the growth of Goss component was promoted during the secondary recrystallization. © 2016, National Institute of Science Communication and Information Resources (NISCAIR). All rights reserved.
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