CVD technologies used in preparation of low dielectric constant materials for ULSI

被引:0
|
作者
Wang, P.F.
Ding, S.J.
Zhang, W.
Wang, J.T.
Li, W.
机构
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [41] Preparation of Porous Silica Ceramics with Low Dielectric Constant
    MAO Xiao-jiana
    Chinese Journal of Aeronautics, 2006, (S1) : 239 - 243
  • [42] Preparation of porous silica ceramics with low dielectric constant
    Mao, Xiao-Jian
    Wang, Shi-Wei
    Shimai, Shun-Zo
    Chinese Journal of Aeronautics, 2006, 19 (SUPPL.):
  • [43] Adhesion energy measurements of multilayer low-K dielectric materials for ULSI applications
    Shaffer, EO
    Mills, ME
    Hawn, D
    Van Gestel, M
    Knorr, A
    Gundlach, H
    Kumar, K
    Kaloyeros, AE
    Geer, RE
    LOW-DIELECTRIC CONSTANT MATERIALS IV, 1998, 511 : 133 - 138
  • [44] Integration Challenges of Nanoporous Low Dielectric Constant Materials
    Kim, Taek-Soo
    Dauskardt, Reinhold H.
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2009, 9 (04) : 509 - 515
  • [45] Research progress of low dielectric constant polymer materials
    Hu, Zhendong
    Liu, Xueqing
    Ren, Tianli
    Saeed, Haroon A. M.
    Wang, Quan
    Cui, Xin
    Huai, Kai
    Huang, Shuohan
    Xia, Yuming
    Fu, Kun
    Zhang, Jianming
    Chen, Yuwei
    JOURNAL OF POLYMER ENGINEERING, 2022, 42 (08) : 677 - 687
  • [46] Research progress on porous low dielectric constant materials
    Xie, Meng
    Li, Menglu
    Sun, Quan
    Fan, Wenjie
    Xia, Shuang
    Fu, Wenxin
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2022, 139
  • [47] Pulsed plasma synthesis of low dielectric constant materials
    Han, LCM
    Timmons, RB
    Lee, WW
    LOW-DIELECTRIC CONSTANT MATERIALS IV, 1998, 511 : 93 - 98
  • [48] Reliability and copper interconnections with low dielectric constant materials
    Hu, CK
    LOW-DIELECTRIC CONSTANT MATERIALS IV, 1998, 511 : 305 - 316
  • [49] Challenges of plasma damage of low dielectric constant materials
    Baklanov, Mikhail R.
    Urbanowicz, Adam M.
    Vanhaelemeersch, Serge
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2007, 234
  • [50] Effect of size on dielectric constant for low dimension materials
    Tian, M.
    Li, M.
    Li, J. C.
    PHYSICA B-CONDENSED MATTER, 2011, 406 (03) : 541 - 544