In situ nanoindentation mechanical property of films by atomic force microscope

被引:0
|
作者
Du, Yuanming [1 ,2 ]
Zhang, Yuefei [2 ]
Zhang, Changhui [2 ]
Liu, Yanping [1 ]
机构
[1] Taiyuan University of Technology, Taiyuan,030024, China
[2] Institute of Microstructure and Properties of Advanced Materials, Beijing University of Technology, Beijing,100124, China
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:1959 / 1963
相关论文
共 50 条
  • [21] Characterization of titanium polycide films by atomic force microscope
    Umapathi, B
    Lahiri, SK
    Kal, S
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 1999, 10 (02) : 97 - 100
  • [22] INVESTIGATION AND PATTERNING OF MOLECULAR FILMS WITH THE ATOMIC FORCE MICROSCOPE
    BRUMFIELD, JC
    GOSS, CA
    IRENE, EA
    MURRAY, RW
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1992, 204 : 53 - ANYL
  • [23] IMAGING OF ORGANIC MOLECULAR FILMS WITH THE ATOMIC FORCE MICROSCOPE
    YAMADA, H
    AKAMINE, S
    QUATE, CF
    ULTRAMICROSCOPY, 1992, 42 : 1044 - 1048
  • [24] Characterization of titanium polycide films by atomic force microscope
    B. Umapathi
    S. K. Lahiri
    S. Kal
    Journal of Materials Science: Materials in Electronics, 1999, 10 : 97 - 100
  • [25] Estimating mechanical properties by indentation with the atomic force microscope
    Costa, KD
    Yin, FCP
    BIOPHYSICAL JOURNAL, 1999, 76 (01) : A264 - A264
  • [26] Combining atomic force microscopy and nanoindentation helps characterizing in-situ mechanical properties of organic matter in shale
    Wang, Jianfeng
    Dziadkowiec, Joanna
    Liu, Yuke
    Jiang, Wenmin
    Zheng, Yijun
    Xiong, Yongqiang
    Peng, Ping'an
    Renard, Francois
    INTERNATIONAL JOURNAL OF COAL GEOLOGY, 2024, 281
  • [27] Fabrication of atomic force microscope spherical tips and its application in determining the mechanical property of cancer cells
    Han, Yimin
    Wang, Jinghe
    Wang, Kui
    Dong, Shen
    MICRO & NANO LETTERS, 2016, 11 (12): : 881 - 884
  • [28] Nanometer-scale photoelectric property of organic thin films investigated by a photoconductive atomic force microscope
    Sakaguchi, Hiroshi
    Iwata, Futoshi
    Hirai, Atsushi
    Sasaki, Akira
    Nagamura, Toshihiko
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1999, 38 (6 B): : 3908 - 3911
  • [29] Nanometer-scale photoelectric property of organic thin films investigated by a photoconductive atomic force microscope
    Sakaguchi, H
    Iwata, F
    Hirai, A
    Sasaki, A
    Nagamura, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (6B): : 3908 - 3911
  • [30] Mechanical properties of porous methyl silsesquioxane and nanoclustering silica films using atomic force microscope
    C. Gaire
    Y. Ou
    H. Arao
    M. Egami
    A. Nakashima
    R. C. Picu
    G.-C. Wang
    T.-M. Lu
    Journal of Porous Materials, 2010, 17 : 11 - 18