共 50 条
- [31] SUPPORTING THE BOUNDLESS GROWTH OF BOUNDARY-SCAN EE-EVALUATION ENGINEERING, 1994, 33 (07): : 58 - +
- [34] A BIST and boundary-scan economics framework IEEE Design and Test of Computers, 14 (03): : 17 - 23
- [35] Managing Complex Boundary-Scan Operations IEEE DESIGN & TEST OF COMPUTERS, 2012, 29 (02): : 100 - 102
- [36] Design of boundary-scan clock cell Xiaoxing Weixing Jisuanji Xitong/Mini-Micro Systems, 19 (02): : 38 - 43
- [40] The BSDL file for boundary-scan testing Journal of Japan Institute of Electronics Packaging, 2020, 23 (01): : 112 - 115