Measurement of image plane illumination non-uniformity of optical system in photoelectric equipment

被引：0
|
作者：
Shen, Xiang-Heng [1 ]
Yang, Liang [1 ,2 ]
He, Geng-Xian [1 ]
Wang, Li [1 ,2 ]
机构：
[1] Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
[2] Graduate University, Chinese Academy of Sciences, Beijing 100039, China
来源：
| 2008年 / Chinese Academy of Sciences卷 / 16期
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摘要：
Optical systems
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