Innovative Test Environment Techniques of Digital Components

被引：0
|
作者：
Bauer, Matthias [1 ]
机构：
[1] Infineon Technologies Ag, Mönchen, Germany
来源：
IT - Information Technology | 2000年 / 42卷 / 05期
关键词：
D O I：
10.1524/itit.2000.42.5.14
中图分类号：
学科分类号：
摘要：
21
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页码：14 / 21
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