THz spectrum analysis with a vector network analyzer

被引:0
|
作者
机构
[1] Technologies, Keysight
来源
Technologies, Keysight | 1600年 / Horizon House卷 / 59期
关键词
User interfaces - Spectrum analyzers - Electric network analyzers - Design for testability;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Device characterization can be challenging and complicated when venturing into the terahertz frequency range. During a typical measurement session, the need to frequently connect, disconnect and reconnect the device under test (DUT) is both inconvenient and time-consuming. One solution is to incorporate VNA and SA capabilities into a single instrument. Keysight offers an integrated system under a single model number, the N5251A mmWave network analyzer. This configuration covers 10 MHz to 110 GHz and currently offers extensions to 1.1 THz. The core instrument is a Keysight PNA microwave network analyzer. The optional spectrum analyzer mode includes a user interface that presents the typical array of setup parameters: center frequency and span, start and stop frequencies, step size, resolution bandwidth (RBW), detector shape, averaging and receiver attenuation. The integration of SA capabilities into a VNA offers two key advantages over the multi-instrument approach: multiple simultaneous measurements and calibrated accuracy. Through its multiple test ports, a VNA enables multi-channel spectrum analysis that is synchronized with the internal swept signal generators. A PNA or PNA-X, through a single connection, provides simultaneous measurements on all DUT ports. With the integrated high performance SA capability, a PNA or PNA-X can perform fast spurious searches across a broad frequency band, improving test time compared to a stand-alone signal analyzer.
引用
收藏
相关论文
共 50 条
  • [21] Wideband extraction of soil dielectric spectrum from vector-network-analyzer measurements
    Lewandowski, Arkadiusz
    Szyplowska, Agnieszka
    Kafarski, Marcin
    Wilczek, Andrzej
    Szerement, Justyna
    Barmuta, Pawel
    Skierucha, Wojciech
    2017 IEEE MTT-S INTERNATIONAL MICROWAVE WORKSHOP SERIES ON ADVANCED MATERIALS AND PROCESSES FOR RF AND THZ APPLICATIONS (IMWS-AMP), 2017,
  • [22] Nonlinear vector network analyzer applications
    Betts, Loren
    Microwave Journal, 2009, 52 (03): : 78 - 92
  • [23] Vector Beam Polarization State Spectrum Analyzer
    Ignacio Moreno
    Jeffrey A. Davis
    Katherine Badham
    María M. Sánchez-López
    Joseph E. Holland
    Don M. Cottrell
    Scientific Reports, 7
  • [24] Calibration of the PTP vector network analyzer
    Hoffmann, K
    Skvor, Z
    MIKON-98: 12TH INTERNATIONAL CONFERENCE ON MICROWAVES & RADAR, VOLS 1-4, 1998, : 710 - 714
  • [25] Design of an enhanced vector network analyzer
    David, FK
    Woodhull, FW
    Barg, RR
    Dunsmore, JP
    Bender, DC
    Brown, BA
    Jaffe, SE
    HEWLETT-PACKARD JOURNAL, 1997, 48 (02): : 66 - &
  • [26] MEASUREMENTS TO TRANSFORMERS WITH A VECTOR NETWORK ANALYZER
    Santana, I. Diaz
    Uribe, F. A.
    PROCEEDINGS OF THE XXII 2020 IEEE INTERNATIONAL AUTUMN MEETING ON POWER, ELECTRONICS AND COMPUTING (ROPEC 2020), VOL 4, 2020,
  • [27] Automatic calibration of the vector network analyzer
    Svirid, MS
    Gusinskiy, AV
    Kostrikin, AM
    14TH INTERNATIONAL CRIMEAN CONFERENCE: MICROWAVE & TELECOMMUNICATION TECHNOLOGY, CONFERENCE PROCEEDINGS, 2004, : 628 - 629
  • [28] NONLINEAR VECTOR NETWORK ANALYZER APPLICATIONS
    Betts, Loren
    MICROWAVE JOURNAL, 2009, 52 (03) : 78 - +
  • [29] Traceability of Vector Network Analyzer Measurements
    Wong, Ken
    72ND ARFTG MICROWAVE MEASUREMENT SYMPOSIUM: TIME DOMAIN AND FREQUENCY DOMAIN MEASUREMENT, 2008, : 157 - 167
  • [30] Comments on "A Novel Vector Network Analyzer"
    Hasar, Ugur Cem
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2010, 58 (09) : 2517 - 2517