Effect of electron-beam processing on the optical and surface properties of quartz glasses

被引:0
|
作者
机构
[1] Zenin, A.A.
[2] Klimov, A.S.
[3] 1,Oks, E.M.
来源
| 2018年 / Federal Informational-Analytical Center of the Defense Industry卷 / 2018-January期
关键词
Quartz - Glass - Morphology - Electrons - Electron energy levels;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] DEVELOPMENTS IN ELECTRON-BEAM AND LASER PROCESSING
    BAKISH, R
    JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, 1992, 44 (06): : 37 - 39
  • [22] EFFECT OF ELECTRON-BEAM PARAMETERS ON UNDULATORY RADIATION PROPERTIES
    NIKITIN, MM
    EPP, VY
    ZHURNAL TEKHNICHESKOI FIZIKI, 1976, 46 (11): : 2386 - 2391
  • [23] Electron-Beam Surface Processing of Metal Materials Manufactured by Additive Methods
    A. D. Teresov
    E. A. Petrikova
    Yu. F. Ivanov
    O. V. Krysina
    N. A. Prokopenko
    Russian Physics Journal, 2023, 65 : 1971 - 1978
  • [24] SCANNING ELECTRON-BEAM PROCESSING OF DEVICES
    MCMAHON, RA
    SPEIGHT, JD
    AHMED, H
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (08) : C364 - C364
  • [25] ELECTRON-BEAM DOSIMETERS FOR RADIATION PROCESSING
    THALACKER, VP
    SIMPSON, JT
    POSTMA, NB
    RADIATION PHYSICS AND CHEMISTRY, 1988, 31 (4-6): : 473 - 479
  • [26] SIGNAL PROCESSING BY ELECTRON-BEAM INTERACTION WITH PIEZOELECTRIC SURFACE-WAVES
    BERT, AG
    EPSZTEIN, B
    KANTOROWICZ, G
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1973, MT21 (04) : 255 - 263
  • [27] LASER AND ELECTRON-BEAM PROCESSING OF SUPERCONDUCTORS
    TACHIKAWA, K
    TOGANO, K
    IEEE TRANSACTIONS ON MAGNETICS, 1987, 23 (02) : 641 - 648
  • [28] ION OPTICAL AND BEAM ENERGY PROPERTIES OF THE ELECTRON-BEAM ION-SOURCE
    SCHMIEDER, RW
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (03): : 1104 - 1109
  • [29] EQUIPMENT ADVANCES FOR ELECTRON-BEAM PROCESSING
    EMANUELSON, R
    FERNALD, R
    SCHMIDT, C
    RADIATION PHYSICS AND CHEMISTRY, 1979, 14 (3-6): : 343 - 351
  • [30] ACCELERATOR REQUIREMENTS FOR ELECTRON-BEAM PROCESSING
    BECKER, RC
    BLY, JH
    CLELAND, MR
    FARRELL, JP
    RADIATION PHYSICS AND CHEMISTRY, 1979, 14 (3-6): : 353 - 375