Analysis and performance of a smart, high-voltage SENSFET

被引：0
|
作者：
Li, Zehong [1 ,2 ]
Wang, Xiaosong [1 ]
Wang, Yiming [1 ]
Yi, Kun [1 ]
Zhang, Bo [1 ]
Li, Zhaoji [1 ]
机构：
[1] State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China
[2] No.24 Research Institute, CETC, Chongqing 400060, China
来源：
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 2007年 / 28卷 / 12期
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摘要：
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页码：1961 / 1966
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