A microcontroller for in situ single-crystal diffraction measurements with a PILATUS-2M detector under an alternating electric field

被引：1
|
作者：
Choe, Hyeokmin [1 ]
Heidbrink, Stefan [1 ]
Ziolkowski, Michael [1 ]
Pietsch, Ullrich [1 ]
Dyadkin, Vadim [2 ]
Gorfman, Semën [1 ,3 ]
Chernyshov, Dmitry [2 ,4 ]
机构：
[1] Department of Physics, University of Siegen, Walter-Flex Strasse 3, Siegen,57072, Germany
[2] Swiss-Norwegian Beamlines, European Synchrotron Radiation Facility, Grenoble,38000, France
[3] Department of Materials Science and Engineering, Faculty of Engineering, Tel Aviv University, Tel Aviv,69978, Israel
[4] Peter the Great St Petersburg Polytechnic University, St Petersburg, Russia
来源：
Journal of Applied Crystallography | 2017年 / 50卷 / 03期
关键词：
Data acquisition;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：975 / 977
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