Convolutional neural network for classification of SiO2 scanning electron microscope images

被引：0
|
作者：
Jayaram, Kavitha [1 ]
Prakash, G. [1 ]
Jayaram, V. [2 ]
机构：
[1] Department of Computer Science and Engineering, Amrita School of Engineering, Amrita Vishwa Vidyapeetham, Bengaluru, India
[2] Solid State and Structural Chemistry Unit, Indian Institute of Science, Bengaluru, India
来源：
International Journal of Business Intelligence and Data Mining | 2022年 / 21卷 / 01期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Convolutional neural networks
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页码：118 / 128
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