Determination of the polymeric thin film thickness by energy dispersive X-ray fluorescence and multivariate analysis

被引:0
|
作者
de Almeida, Eduardo [1 ]
Melquiades, Fábio L. [2 ]
Marques, João P.R. [1 ]
Marguí, Eva [3 ]
de Carvalho, Hudson W.P. [1 ]
机构
[1] Center for Nuclear Energy in Agriculture, University of São Paulo, Av. Centenário, 303, Piracicaba,SP,13416000, Brazil
[2] Physics Department, State University of Londrina, Rodovia Celso Garcia Cid, PR 445, km 380, Londrina,PR,86057-970, Brazil
[3] Department of Chemistry, University of Girona, C/Maria Aurèlia Capmany, 69, Girona,17003, Spain
基金
巴西圣保罗研究基金会;
关键词
25;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Gaseous detectors for energy dispersive X-ray fluorescence analysis
    Veloso, J. F. C. A.
    Silva, A. L. M.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2018, 878 : 24 - 39
  • [22] ENERGY DISPERSIVE X-RAY FLUORESCENCE (EDXRF) ANALYSIS OF STEELS
    Toma, Lucica Grigora
    Ion, Rodica Mariana
    Fierascu, Radu Claudiu
    Ion, Nelu
    Popescu, Ileana Nicoleta
    JOURNAL OF SCIENCE AND ARTS, 2010, (02): : 385 - 390
  • [24] Multivariate analysis of the energy dispersive x-ray fluorescence results from blue and white Chinese porcelains
    Yu, KN
    Miao, JM
    ARCHAEOMETRY, 1998, 40 : 331 - 339
  • [25] Method for forward energy-dispersive X-ray fluorescence analysis of thin and intermediate samples
    Universita di Sassari, Sassari, Italy
    Nucl Instrum Methods Phys Res Sect B, 3 (434-448):
  • [26] A method for forward energy-dispersive X-ray fluorescence analysis of thin and intermediate samples
    Cesareo, R
    Gigante, GE
    Hanson, AL
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 145 (03): : 434 - 448
  • [27] Fixed-angle, energy-dispersive X-ray reflectivity measurement of thin tantalum film thickness
    Windover, D
    Barnat, E
    Summers, J
    Lu, TM
    Kumar, A
    Bakhru, H
    Lee, SL
    JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (08) : 848 - 856
  • [28] Fixed-angle, energy-dispersive x-ray reflectivity measurement of thin tantalum film thickness
    D. Windover
    E. Barnat
    J. Summers
    T. -M. Lu
    A. Kumar
    H. Bakhru
    S. L. Lee
    Journal of Electronic Materials, 2002, 31 : 848 - 856
  • [29] Study and determination of pure element intensities for energy-dispersive X-ray fluorescence analysis
    Hua, YN
    JOURNAL OF TRACE AND MICROPROBE TECHNIQUES, 2001, 19 (01): : 25 - 33
  • [30] Direct analysis of marine macroalgae for determination of macro minerals by energy dispersive X-ray fluorescence
    Brito, Geysa B.
    Teixeira, Leonardo S. G.
    Korn, Maria Gracas A.
    MICROCHEMICAL JOURNAL, 2017, 134 : 35 - 40