Anti aging controllable true random number generator for secured AES-based crypto system

A tetrahedral oscillator-based true random number generator for secret key generation in cryptosystem has been proposed. The circuit is made to behave correctly for a long time. By applying pass transistors, the aging effects due to hot carrier injection (HCI) and negative bias temperature instability (NBTI) are reduced. This fact is helpful to achieve the goal and its performances have also been improved. Pass transistor makes the transistors to operate only at enabling times. Thus, bit flipping in normal designs are reduced. Due to the complexity in the tetrahedral oscillator hacking will be very tough. The secret key generated from TRNG circuit is adopted in advanced encryption standard (AES) cryptosystem to maintain an off-chip database. Moreover, controlling circuits for TRNG have been introduced because in any of the cryptosystem man-in-middle attack is possible. To avoid this controlling circuits are used to identify the authenticity of customers. Simulation results explain that our aging resistant design can be used for generating more reliable keys. Although the operating conditions changes, the DC operating point of the system does not change more. The randomness is also shown through NIST tests. Copyright © 2019 Inderscience Enterprises Ltd.