Multiresolution Phase-Contrast Tomography at BM18

被引：0

作者：

Lang, Thomas ^{[1
]}

Saeidnezhad, Nazila ^{[1
]}

Dremel, Kilian ^{[1
]}

Weller, Daniel ^{[1
]}

Diez, Matthias ^{[3
]}

Stock, A. Michael ^{[2
]}

Sauer, Tomas ^{[1
,2
]}

Cianciosi, Filippo ^{[4
]}

Jarnias, Christophe ^{[4
]}

Tafforeau, Paul ^{[4
]}

Zabler, Simon ^{[1
]}

机构：

[1] Fraunhofer Institute of Integrated Circuits IIS, Division Development Center X-ray Technology, Fürth, Germany

[2] FORWISS, University of Passau, Passau, Germany

[3] Julius-Maximilians-Universität Würzburg, Würzburg, Germany

[4] European Synchrotron Radiation Facility, Grenoble, France

来源：

e-Journal of Nondestructive Testing | 2023年 / 28卷 / 03期

关键词：

Compendex;

D O I：

10.58286/27746

中图分类号：

学科分类号：

摘要：

Large datasets

引用

共 50 条

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